Combination multifunctional X-ray diffractometer AL-Y3500

Product Introduction of multifunctional X-ray diffractometer:

The Aolong X-ray diffractometer Y3500 is a modular X-ray diffractometer that integrates multiple analytical methods onto a single platform. The X-ray diffractometer Y3500's design concept is simple: whether it's conventional powder XRD, thin film materials, low-angle structures, or experiments requiring variable geometry, the X-ray diffractometer Y3500 can be easily switched through modular combinations, freeing up the laboratory from cluttered with various individual devices. For users who need to balance scientific research and daily testing, it's a "universal experimental station."

Product Advantages of multifunctional X-ray diffractometer:

The most attractive feature of the multifunctional X-ray diffractometers is its scalability. Different experimental needs can be met by directly changing the sample stage, detector components, or optical path modules, without the need for disassembly and major instrument overhauls. This not only saves costs but also reduces equipment downtime. Furthermore, the multifunctional X-ray diffractometer's built-in automatic calibration and geometric error compensation functions ensure high data consistency regardless of how many measurement modes are switched. The X-ray diffractometer Y3500's open interface also allows for later detector upgrades or the addition of special accessories, extending the instrument's lifespan.

Application Areas of Combination X-ray diffractometers: 

Aolong's X-ray diffractometer Y3500 is particularly suitable for laboratories with a wide range of sample types, such as new materials R&D teams, university materials departments, functional thin film research institutions, semiconductor companies, ceramic factories, and energy materials laboratories. Combination X-ray diffractometers can perform phase analysis of nanoparticles, detect crystal orientation, residual stress, or interface structure of thin films, and handle complex diffraction tests on multilayer materials. For R&D departments that need to constantly switch research directions, Combination X-ray diffractometers can easily adapt to different research themes, from basic research to factory quality control.

Applied in various fields of material structure analysis. Materials that can be analyzed include: metal materials, inorganic materials, composite materials, organic materials, nanomaterials, superconducting materials; The material status includes: powder sample, block sample, thin film sample, and micro area trace sample.

Widely used in research fields such as clay minerals, cement building materials, environmental dust, chemical products, pharmaceuticals, asbestos, rock minerals, polymers, etc

Instrument features of Combination X-ray diffractometers:

● The perfect combination of hardware and software systems to meet the needs of scholars and researchers in different application fields

● High precision diffraction angle measurement system to obtain more accurate measurement results

● High stability X-ray generator control system, achieving more stable repeated measurement accuracy

● Various functional accessories meet the needs of different testing purposes

● Programmed operation, integrated structural design, easy operation, and more aesthetically pleasing instrument appearance

● Identification of one or more phases in unknown samples

● Quantitative analysis of known phases in mixed samples

● Crystal structure analysis (Rietveld structure analysis)

● Changes in crystal structure under unconventional conditions (high and low temperature conditions)

● Film sample analysis, including film phase, multi-layer film thickness, surface roughness, and charge density

● Analysis of micro area samples

● Texture and stress analysis of metal materials

Certifications and Qualifications: 

As a renowned trademark enterprise in Liaoning Province, Aolong Group's brand influence is deeply rooted in the hearts of consumers. We continuously pursue excellence, driving the industrialization of X-ray diffractometer Y3500, and have been recognized by the state as a high-tech industrialization demonstration project. Our products have obtained both ISO and CE certifications, meeting global market access standards and are exported to Europe, America, Southeast Asia, and Africa. These honors and certifications are the result of Aolong's long-term commitment to technological leadership and superior quality, and are the foundation for winning customer trust and long-term cooperation.

About Us: 

Aolong continuously invests in software development, resulting in an image processing and defect recognition system with independent intellectual property rights. Multifunctional X-ray diffractometers features ease of operation, intelligent interpretation, and automatic report generation, significantly reducing manual workload. Through intelligent algorithms, detection consistency and efficiency are significantly improved. The combination of software and hardware enables Aolong equipment to adapt to more complex working conditions, helping customers improve quality management and save costs.