Portable X-ray Fluorescence Xrf Analysis
- Aolong
- China
- 15 days
- 300pc/year
Using Portable X-ray fluorescence Xrf analysis technology, The X-ray fluorescence is capable of measuring various elements in the substance simultaneously. The portable xrf can be configured to measure any multiple elements from Na to U according to the user's application requirements. The xrf analysis can be widely used in the environmental protection, archaeology, building materials, RoHS directive and other industries. The portable xrf is the ideal choice of quality control for the enterprise.
Basic principle of XRF analysis
The electron orbital potential energy of the various elements is different from each other.Therefore, the x-ray photon energy emitted after excitation is different from each other，i.e.，each element emitsx一rays with the specific energy of the atom of that element, which represents the characteristics of the element and is therefore called the characteristic X-ray of the element. The characteristic X-ray of each element has its specific energy, and the X-ray detected with certain energy can determine the existence of this element in the material sample.
Portable X-ray fluorescence work principle
The original X-ray produced by X-ray tube and high voltage is irradiated on the sample after being properly filtered by the optical filter.The characteristic X-ray (called X-ray fluorescence) of the elements contained in the sample is stimulated. X-ray fluorescence spectra were obtained by using X-ray detectors with high energy resolution. Different elements formed different spectral peaks on the spectra. The strength of the spectral peak is directly proportional to the content of elements in the sample. The energy spectrum detected by the detector is analyzed by the computer.The types of elements contained in the sample are qualitatively analyzed by the position and shape of thespectral peak.
The portable xrf is equipped with Si(PIN) or SDD detector.
The resolution of detector is one of the main indexes to evaluate the performance of The portable XRF.
Resolution <145eV (The lower the resolution, the higher the sensitivity.)
Counting rate > 1000/S
Crystal area > 15mm2
Beryllium window thickness = 0.025mm
Detector power < 1.2W
Technical parameters
| Model | AL-NP-6010A | |
| Size weight | 353mm(L)×233mm(w)×200mm(H) 7.68kg | |
| Anylysis principle | Portable energy dispersive X-ray fluorescence analysis | |
| Element measuring range | Any element from Na(11)~U(92) | |
| Min.measuring limit | Cd/Hg/Br/Cr/Pb≤2ppm | |
| Sample shape | Arbitrary size, any irregular shape | |
| Sample type | Plastic/Metal/Film/Power/Liquid etc | |
| X ray tube | Target material | Mo |
| Tube voltage | 5~50KV | |
| Tube current | 1~1000μA | |
| Sample exposure diameter | 2,5,8mm | |
| Detector | Si-Pin or SDD detector,high speed pulse height analysis system | |
| High voltage generator | Special HV generator for X-ray fluorescence | |
| ADC | 2048 channels | |
| Xrf Analysis software | Patented software products,free upgrade for life | |
| Xrf Analysis method | Theoretical α coefficient method,basic parameter method,empirical coefficient method | |
| Analysis time | 30~900 seconds,adjustable | |
| Operating system software | WINDOWS XP | |
| Data processing system | Host | Notebook computer |
| CPU | ≥2.8G | |
| Memory | ≥2g | |
| CD-ROM | 8×DVD | |
| Hard disk | ≥500G | |
| Display | 14″ LCD display | |
| Working environment | Temperature 10~35℃，humidity 30~90% RH | |
Convincing inspection solition supplier
More than 50 years, Aolong Group focuses on the Non-destructive Testing Technologies and gives our customers the best inspection solution with the high quality radiographic equipment with simple operation and complete functions.
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