equip machine

The X-ray fluorescence coating thickness gauge is an analytical instrument that uses energy dispersive X-ray fluorescence analysis technology to simultaneously measure multiple elements. It can be configured to analyze and determine any number of elements from Na to U according to user application requirements.

The system architecture design is simple and compact, which is a set of high-resolution X-ray industrial CT systems with flexible configuration and can meet various detection needs. It has the characteristics of high imaging resolution, fast scanning speed, rich functions, easy operation, stable operation, and low usage and maintenance costs.

Using Portable X-ray fluorescence Xrf analysis technology, The X-ray fluorescence is capable of measuring various elements in the substance simultaneously. The portable xrf can be configured to measure any multiple elements from Na to U according to the user's application requirements. The xrf analysis can be widely used in the environmental protection, archaeology, building materials, RoHS directive and other industries. The portable xrf is the ideal choice of quality control for the enterprise.

Industrial computer tomography system is composed of the high frequency and constant voltage x-ray source,digital flat panel detector, and high precision mechanical inspection table. The Industrial CT system not only displays the CT chip and 3D images of the inspected object, but also with 2D real-time imaginginspection. So Industrial radiography CT is widely used for NDT inspection and measurement in aerospace,aviation military, machinery, casting, IT, automobile field, etc.

The wavelength dispersive X-ray fluorescence analyzer is a high-tech product developed by our company, which summarizes the experience and lessons learned from the development of this type of instrument in China over the years, and absorbs and references advanced international technologies. Through in-depth industrial research and development, all technical performance indicators have reached the level of similar international products.

X-ray fluorescence spectrometer (XRF) is a state-of-art universal analysis method for elemental determination of various materials. XRF analizador is characterized by simple sample preparation, wide range of measurement elements，high accuracy, good reproducibility,fast measuring speed (30s to 900s), no environmental pollution and no damage to samples.

Pipeline Crawler X-Ray System adopts our company's independent designed constant tube current control system, completely solves the problems of battery power reducing and film bad resolution of traditional pipeline inspection crawler.

The AL-Y3000 diffractometer is designed for material research and industrial product analysis, and is a comprehensive product that combines conventional analysis with special purpose measurements.

The AL-Y500 diffractometer is the latest desktop two-dimensional X-ray diffractometer launched by Aolong Group. It uses a fixed detector for photography, which is different from traditional scanning diffractometers. The X-ray array photon counting semiconductor detector has point, line, and plane 0D, 1D, and 2D compatibility modes;